Applications and Metrology at Nanometer Scale 1. Abdelkhalak El Hami

according to theoretical models based on quantum mechanics principles requiring field theory is also given particular attention.

      Nanotechnologies and nanosciences are identified as sources of breakthrough innovations that will lead to the development of technologies that are considered primordial in the 21st Century. They should be deployed in eco-innovations and will increasingly become pervasive in the societal applications in various sectors. Without pretending to provide an exhaustive list, several examples are worth being mentioned: new energies and their recovery and storage, water purification, new materials that are lighter and more resilient for land and space transportation, construction and buildings, information technologies with quantum computers, embedded electronic systems and factory 4.0. The trend according to which states throughout the world offer financial support for the development of long-term projects in this field dates back to the beginning of the 21st Century. This is a reflection of the economic growth potential in nanotechnologies.

Similar to the inflationary model proposed by cosmologists to explain the countless galaxies and planetary systems, suns and black holes that constitute them, there was also a sharp increase in the volume of activities in nanosciences. The subjects approached in this book and in the Reliability of Multiphysical Systems Set Book 2 (Nanometer-scale Defect Detection Using Polarized Light) concern the field of engineers working in mechatronics, robotics and computation in modeling and simulation, for the societal spin-offs of nanotechnologies in the fields of land and space transportation, handicap, information and simulation technologies in a systemic approach. The level of knowledge acquired by the engineer should make innovation in nanotechnologies possible.

      The contents of Nanometer-scale Defect Detection Using Polarized Light and Applications and Metrology at Nanometer Scale 1 & 2, jointly written by three authors, aim to develop knowledge that is essential at the nanometer scale, enabling trainee-engineers or engineers to develop nanotechnology- based devices or systems. To promote the deployment of nanotechnologies, the authors of these three books whose joint competences and experiences associate know-how in fundamental physics, engineering sciences and industrial activities cover a wide spectrum of application domains. Nanometer-scale Defect Detection Using Polarized Light builds a theoretical and experimental basis for understanding nanometer-scale metrology. This book in two volumes, Applications and Metrology at Nanometer Scale, enriches this theoretical basis with applications in the form of corrected exercises.