CompTIA Project+ Study Guide. Heldman Kim

p>Kim Heldman

      CompTIA® Project+® Study Guide Exam PK0-004

Project+^®Study GuideExam PK0-004Second Edition

Kim Heldman

      Senior Acquisitions Editor: Kenyon Brown

      Development Editor: James A. Compton

      Technical Editor: Vanina Mangano

      Production Editor: Dassi Zeidel

      Copy Editor: Kim Wimpsett

      Editorial Manager: Mary Beth Wakefield

      Production Manager: Kathleen Wisor

      Executive Editor: Jim Minatel

      Book Designers: Judy Fung and Bill Gibson

      Proofreader: Kathy Pope, Word One New York

      Indexer: Ted Laux

      Project Coordinator, Cover: Brent Savage

      Cover Designer: Wiley

      Cover Image: ©Jeremy Woodhouse/Getty Images, Inc.

      Copyright © 2017 by John Wiley & Sons, Inc., Indianapolis, Indiana

      Published simultaneously in Canada

      ISBN: 978-1-119-28052-1

      ISBN: 978-1-119-28054-5 (ebk.)

      ISBN: 978-1-119-28053-8 (ebk.)

      Manufactured in the United States of America

      No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, scanning or otherwise, except as permitted under Sections 107 or 108 of the 1976 United States Copyright Act, without either the prior written permission of the Publisher, or authorization through payment of the appropriate per-copy fee to the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923, [phone], fax [phone]. Requests to the Publisher for permission should be addressed to the Permissions Department, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, [phone], fax [phone], or online at http://www.wiley.com/go/permissions.

      Limit of Liability/Disclaimer of Warranty: The publisher and the author make no representations or warranties with respect to the accuracy or completeness of the contents of this work and specifically disclaim all warranties, including without limitation warranties of fitness for a particular purpose. No warranty may be created or extended by sales or promotional materials. The advice and strategies contained herein may not be suitable for every situation. This work is sold with the understanding that the publisher is not engaged in rendering legal, accounting, or other professional services. If professional assistance is required, the services of a competent professional person should be sought. Neither the publisher nor the author shall be liable for damages arising herefrom. The fact that an organization or Web site is referred to in this work as a citation and/or a potential source of further information does not mean that the author or the publisher endorses the information the organization or Web site may provide or recommendations it may make. Further, readers should be aware that Internet Web sites listed in this work may have changed or disappeared between when this work was written and when it is read.

      For general information on our other products and services or to obtain technical support, please contact our Customer Care Department within the U.S. at [phone], outside the U.S. at [phone] or fax [phone].

      Wiley publishes in a variety of print and electronic formats and by print-on-demand. Some material included with standard print versions of this book may not be included in e-books or in print-on-demand. If this book refers to media such as a CD or DVD that is not included in the version you purchased, you may download this material at http://booksupport.wiley.com. For more information about Wiley products, visit www.wiley.com.

      Library of Congress Control Number: 2016960612

      TRADEMARKS: Wiley, the Wiley logo, and the Sybex logo are trademarks or registered trademarks of John Wiley & Sons, Inc. and/or its affiliates, in the United States and other countries, and may not be used without written permission. CompTIA and Project+ are registered trademarks of CompTIA Properties LLC. All other trademarks are the property of their respective owners. John Wiley & Sons, Inc. is not associated with any product or vendor mentioned in this book.

To Kate and Juliette, project managers in the making

      Acknowledgments

      Thank you for buying the second edition of CompTIA Project+ Study Guide Exam PK0-004 to help you study and prepare for the CompTIA Project+ exam. I believe this book is a good introduction to the in-depth world of project management and certification and will open up many opportunities for you.

      I would like to thank all the great team members at Wiley who were part of this project: Kenyon Brown, senior acquisitions editor; Jim Compton, development editor; Dassi Zeidel, production editor; and all those behind the scenes who helped make this book a success. They are terrific to work with, as always, and I appreciate their keen eyes and insightful ideas and suggestions.

      Special thanks go to Vanina Mangano for her work as technical editor. I appreciate her diligence and great suggestions that helped make the content stronger.

      And a thank-you, as always, goes to my family for their understanding of my crazy schedule. Kate and Juliette, you’re the best!

      About the Author

      Kim Heldman, MBA, PMP ^® is the CIO for the Regional Transportation District in Denver, Colorado. Kim directs IT resource planning, budgeting, project prioritization, and strategic and tactical planning. She directs and oversees IT design and development, enterprise resource planning systems, IT infrastructure, application development, cybersecurity, IT program management office, intelligent transportation systems, and data center operations.

      Kim oversees the IT portfolio of projects ranging from small in scope and budget to multimillion-dollar, multiyear projects. She has more than 25 years of experience in information technology project management. Kim has served in a senior leadership role for more than 18 years and is regarded as a strategic visionary with an innate ability to collaborate with diverse groups and organizations, instill hope, improve morale, and lead her teams in achieving goals they never thought possible.

      Kim is also the author of PMP^® Project Management Professional Exam Study Guide, 8th Edition; Project Management JumpStart 3rd Edition; and Project Manager’s Spotlight on Risk Management. She is the coauthor of PMP^® Project Management Professional Exam Deluxe Study Guide, 2nd Edition, and the PMP^® Project Management Professional Exam Review Guide, 3rd Edition. Kim has also published several articles and is currently working on a leadership book.

      Kim continues to write on project management best practices and leadership topics, and she speaks frequently at conferences and events. You can contact Kim at [email protected]. She personally answers all her email.

      Introduction

      Have you ever wondered how the pyramids were built? Or the Eiffel Tower? How did someone have the organizational skills to put all those people together and create such magnificent structures? Coming forward to recent times – how is Microsoft capable of putting together literally millions of lines of code for its latest operating system? The answer to all of these is project management.

      The CompTIA Project+ exam will test your knowledge of the concepts and processes involved in project management. There are several project management methodologies you can follow, each with their own processes and procedures,