Product Maturity, Volume 2. Franck Bayle

      

Table of Contents

      1  Cover

      2  Title Page

      3  Copyright

      4  Foreword by Laurent Denis

      5  Foreword by Serge Zaninotti

      6  Acknowledgements

      7  Introduction

      8  1 Sampling in Manufacturing 1.1. Cost aspects 1.2. Considering the distribution of defects 1.3. Considering the test coverage

      9  2 Compliance Test

      10  3 Non-Regression Tests 3.1. Non-regression on a physical quantity 3.2. Non-regression depending on time

      11  4 Zero-Failure Reliability Demonstration 4.1. Purpose of zero-failure tests 4.2. Theoretical principle 4.3. Optimization of test costs 4.4. Specific cases

      12  5 Reliability Management 5.1. Context 5.2. Physical architecture division 5.3. Classification of subsets 5.4. Allocation of initial reliability 5.5. Estimation of the reliability of subsets 5.6. Optimal allocation of the reliability of subsets 5.7. Illustration 5.8. Definition of design rules 5.9. Construction of a global predicted reliability model with several manufacturers

      13  6 Confirmation of Maturity 6.1. Internal data from equipment manufacturer 6.2. System manufacturer data 6.3. End-customer data 6.4. Burn-in optimization

      14  List of Notations

      15  List of Definitions

      16  List of Acronyms

      17  References

      18  Index

      19  End User License Agreement

      List of Illustrations

      1 Chapter 1Figure 1.1. Evolution of the total average cost depending on the size of the sam...Figure 1.2. Evolution of the total average cost depending on the size of the sam...Figure 1.3. Evolution of the total average cost depending on the size of the sam...Figure 1.4. Evolution of the total average cost depending on the sample size – E...Figure 1.5. Evolution of the total average cost depending on the sample size – E...Figure 1.6. Evolution of the total average cost depending on the sample size – E...Figure 1.7. Illustration

      2 Chapter 2Figure 2.1. Overview diagram of the non-compliance testFigure 2.2. Test of normality

      3 Chapter 3Figure 3.1. Overview diagram of non-regression on a physical quantityFigure 3.2. Test of normality on variable 1Figure 3.3. Test of normality on variable 2Figure 3.4. Diagram of a non-regression testFigure 3.5. Example of a non-regression test

      4 Chapter 4Figure 4.1. Example of demonstration of reliability of non-maintained productsFigure 4.2. Testing time depending on the number of parts of non-maintained prod...Figure 4.3. Example of reliability demonstration for maintained productsFigure 4.4. Testing time depending on the number of parts of maintained productsFigure 4.5. Weibull plot for the welding strength during thermal cyclingFigure 4.6. Weibull plot of electrolytic capacitorsFigure 4.7. Example of optimum cost for tests of non-maintained productsFigure 4.8. Example of optimum cost of testing maintained productsFigure 4.9. Survival function for the two testsFigure 4.10. Example of MTBF demonstrated with two testsFigure 4.11. Demonstrated reliability under various conditionsFigure 4.12. Reliability demonstrated under various conditionsFigure 4.13. Principle of testing the same parts under different conditionsFigure 4.14. Temperature profile under different conditionsFigure 4.15. Objective failure rate

      5 Chapter 5Figure 5.1. Overview diagram of product reliability managementFigure 5.2. Principle of product division into subsets (S/S)Figure 5.3. Example of how the proper manufacturing of coins can be verifiedFigure 5.4. Credibility curve example 5.1Figure 5.5. Credibility curve example 5.2Figure 5.6. Credibility curve example 5.3Figure 5.7. Illustration of reliability managementFigure 5.8. Initial reliability allocation of the subsets in case of reliability...Figure 5.9. Initial reliability allocation of the subsets in case of MTBF object...Figure 5.10. Reliability allocation of the subsets in case of reliability object...Figure 5.11. Reliability allocation of the subsets in case of MTBF objective aft...Figure 5.12. Weibull plot voltage reference reliability testFigure 5.13. 3D Weibull plot voltage reference reliability testFigure 5.14. Final reliability