Conductive Atomic Force Microscopy. Applications in Nanomaterials. Mario Lanza
Прочая образовательная литература.
Conductive Atomic Force Microscopy. Applications in Nanomaterials
Год выпуска 0
isbn 9783527699780
Автор произведения Mario Lanza
Жанр Прочая образовательная литература
Издательство John Wiley & Sons Limited
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.