Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques. Отсутствует
Зарубежная образовательная литература.
Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques
Год выпуска 0
isbn 9783527639564
Автор произведения Отсутствует
Жанр Зарубежная образовательная литература
Издательство John Wiley & Sons Limited
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.